Quality factor enhancement of an atomic force microscope micro-cantilever using piezoelectric shunt control

Title: Quality factor enhancement of an atomic force microscope micro-cantilever using piezoelectric shunt control
Creator: Fairbairn, Matthew W.; Moheimani, S.O. Reza
Relation: 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) . Proceedings of the 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) (Kaohsiung, Taiwan 11-14 July, 2012) p. 556-561
Publisher Link: http://dx.doi.org/10.1109/AIM.2012.6265890
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Resource Type: conference paper
Date: 2012
Description: The quality (Q) factor of the Atomic Force Microscope (AFM) micro-cantilever influences both the maximum scan speed and image quality when operating in tapping mode. Increasing the Q factor of the micro-cantilever results in an increase in force sensitivity and a reduction in tapping force. Active piezoelectric shunt control uses an active electrical impedance to modify the mechanical dynamics of the cantilever. An increase in the effective Q factor of a piezoelectric AFM micro-cantilever by over 25 times has been demonstrated using this technique.
Identifier: http://hdl.handle.net/1959.13/1313163
Identifier: uon:22531
Identifier: ISBN:9781467325752
Language: eng
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